DocumentCode
2982162
Title
Low cost TID testing of COTS components
Author
Barnard, A. ; Steyn, W.H.
Author_Institution
Dept. of Electr. & Electron. Eng., Stellenbosch Univ., Stellenbosch, South Africa
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
1
Lastpage
4
Abstract
A low cost methodology for testing components at intermediate TID rates for use in South African space projects is presented. The test results are used to evaluate this approach´s viability and identify aspects to improve.
Keywords
dosimetry; electron device testing; space vehicle electronics; COTS component; South African space project; TID testing; commercial off the shelf component; intermediate TID rate; low cost methodology; total ionization dose; Aerospace testing; Biological materials; Costs; Gravity; Insects; Pneumatic systems; Radiation safety; Satellites; Shafts; Test facilities; Aerospace testing; Radiation effects; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location
Deauville
ISSN
0379-6566
Print_ISBN
978-1-4244-1704-9
Type
conf
DOI
10.1109/RADECS.2007.5205562
Filename
5205562
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