DocumentCode :
2982204
Title :
Macro model development as a bridge between factory level simulation and LP enterprise systems
Author :
Allison, Ruth Anne Hunter ; Yu, Jason ; Tsai, Li-Hui ; Liu, Chihwei ; Drummond, Mark ; Kayton, Dave ; Sustae, Tom ; Witte, Jim
fYear :
1997
fDate :
13-15 Oct 1997
Firstpage :
408
Lastpage :
416
Abstract :
The representation of a factory-level capacity model and an enterprise-level model have traditionally been incompatible. The goal of this study is to resolve the incompatibility problem. Factory systems contain detailed data striving to accurately predict facility capabilities. Enterprise optimization systems prefer an aggregation of data, representing key bottleneck resources throughout a corporation. The focus on key resources reduces modeling complexity and subsequently reduces the problem solving cycle. This study attempts to build a bridge between the capabilities of a factory simulation-based capacity planning software tool, ManSim(R)/X, and an enterprise optimization system, TEOS TM (TYECIN Enterprise Optimization System), both from TYECIN Systems Inc. The project involves studying the predecessor of TEOS (IMPReSS 2.0) at Harris Semiconductor in Findlay, Ohio
Keywords :
discrete event simulation; linear programming; manufacturing data processing; manufacturing resources planning; semiconductor device manufacture; Harris Semiconductor; IMPReSS 2.0; LP system; ManSim/X; TEOS; TYECIN Systems; bottleneck resources; capacity planning software; enterprise optimization; factory level simulation; macromodel; Aggregates; Bridges; Capacity planning; Computational modeling; Enterprise resource planning; Problem-solving; Production facilities; Scheduling; Software tools; Virtual prototyping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1997., Twenty-First IEEE/CPMT International
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3929-0
Type :
conf
DOI :
10.1109/IEMT.1997.626953
Filename :
626953
Link To Document :
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