DocumentCode :
2982846
Title :
Characterization Of Snow Grain Size In The Near-infrared And Microwave Wavelengths
Author :
Nolin, Anne W. ; Shi, Jiancheng ; Dozier, Jeff
Author_Institution :
University of California
fYear :
1993
fDate :
22-25 Mar 1993
Firstpage :
51
Lastpage :
54
Keywords :
Backscatter; Grain size; Ice; Microwave theory and techniques; Optical scattering; Optical sensors; Particle scattering; Rayleigh scattering; Reflectivity; Snow;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Combined Optical, Microwave, Earth and Atmosphere Sensing, 1993., Proceedings of IEEE Topical Symposium on
Print_ISBN :
0-7803-0969-3
Type :
conf
DOI :
10.1109/COMEAS.1993.700179
Filename :
700179
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2982846
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