• DocumentCode
    2982883
  • Title

    Hierarchical modeling of carbon nanoribbon devices for CNR-FETs engineering

  • Author

    Grassi, R. ; Gnudi, A. ; Gnani, E. ; Reggiani, S. ; Cinacchi, G. ; Baccarani, G.

  • Author_Institution
    DEIS, Univ. of Bologna, Bologna
  • fYear
    2008
  • fDate
    23-25 June 2008
  • Firstpage
    105
  • Lastpage
    106
  • Abstract
    Most of the attractive electrical properties of carbon nano-tubes (CNT), such as 1D transport and very large mobilities, are also shared by carbon nanoribbons (CNR), which can potentially overcome the growth control problems of CNTs. Since experimental demonstration of CNR field effect transistors (FET) is at an early stage, simulation studies are important to investigate their theoretical limits. In the literature one can find simplified semiclassical models and full atomistic tight binding (TB) models. Both have limitations: in the former case, direct and band-to-band tunneling effects are ignored, in the latter deep physical insight is achieved at the price of very long computational times. Here we present a hierarchical approach to the modelling of CNR-FETs, which blends together first-principle density functional theory (DFT) for subband calculations, full 2D atomistic TB modelling, and effective mass (EM) ID quantum transport modelling, improved with nonparabolic (NP) corrections. The approach is applicable to armchair semiconductor CNRs. Moving along the hierarchy of models from the most physically in-depth (DFT) to the most details-free (EM) approach, more accurate models are used to calibrate the parameters of less accurate ones. In-depth models are suitable for the simulation of very small FETs (both narrow and short ribbons), but are impractical for devices of large sizes, which however are the ones that can be fabricated with the state-of-the-art technology. For such devices, where quantum effects already play a major role, the NPEM approach is quite effective.
  • Keywords
    carbon nanotubes; density functional theory; field effect transistors; semiconductor device models; CNR-FET; carbon nanoribbon devices; carbon nanotubes; density functional theory; tight binding models; Dispersion; Eigenvalues and eigenfunctions; FETs; Geometry; Kinetic energy; Nanoscale devices; Physics computing; Quantum computing; Slabs; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2008
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-1942-5
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2008.4800756
  • Filename
    4800756