DocumentCode :
2982977
Title :
Accurate fault location of two-terminal transmission line based on one end voltage measurement and Smooth Support Vector Machines
Author :
Alanzi, Eyada A J ; Younis, Mahmoud A A
Author_Institution :
Electr. Power Eng., Univ. Tenaga Nasional, Kajang, Malaysia
fYear :
2011
fDate :
19-22 Feb. 2011
Firstpage :
485
Lastpage :
488
Abstract :
This paper presents a new technique for accurate fault location based on voltage measurement from one end of the two-terminal transmission line and Smooth Support Vector Machine (SSVM). Due to common problems of current transformer during fault location and as a result increasing the cost and reduction of the accuracy, proposed technique is independent of current measurement and based on one terminal voltage measurement of the transmission line. Post-fault voltage at one end of the line is measured and used in calculation of the fault location. GPS (global positioning system) is not required for this technique resulting in a reduction of economic cost. Using the proposed technique, fault location can be estimated with a lower than 0.025% error without using current transformers and GPS. EMTP/ATP simulation and SSVM results show that the proposed fault location technique is independent of fault type, fault resistance and fault inception of the transmission line.
Keywords :
EMTP; electric current measurement; fault location; power transmission faults; power transmission lines; support vector machines; voltage measurement; EMTP-ATP simulation; alternative transient program; current measurement; electro magnetic transient program; fault inception; fault location technique; fault resistance; fault type; smooth support vector machines; terminal voltage measurement; two-terminal transmission line; Accuracy; Fault location; Kernel; Power transmission lines; Support vector machines; Transmission line measurements; Voltage measurement; ATP-EMTP; Fault location; Smooth Support Vector Machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
GCC Conference and Exhibition (GCC), 2011 IEEE
Conference_Location :
Dubai
Print_ISBN :
978-1-61284-118-2
Type :
conf
DOI :
10.1109/IEEEGCC.2011.5752591
Filename :
5752591
Link To Document :
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