Title :
Fault-tolerance and terminal reliability for a class of data manipulator networks
Author :
Abd-El-Barr, Mostafa ; Abed, Osama
Author_Institution :
Dept. of Comput. Eng., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Abstract :
Data manipulators networks are a class of multistage interconnection networks (MINs). A number of attempts has been made to make this class of MINs fault tolerant. They assume that the input stage as well as the output stage are fault-free. In this paper, we propose an enhancement to the fault-tolerance capability of two categories of this class of networks, Enhanced Augmented Data Manipulator Network (EADM), and Logical Neighborhood Networks (LN) under a more strict fault-model. The fault-tolerance and the terminal reliability for each of the resulting networks is introduced. A comparison between these two proposed networks is made
Keywords :
circuit reliability; fault tolerant computing; multistage interconnection networks; data manipulator networks; enhanced augmented type; fault-model; fault-tolerance; logical neighborhood networks; multistage interconnection networks; terminal reliability; Computer network reliability; Computer networks; Delta modulation; Fault tolerance; Minerals; Multiprocessor interconnection networks; Network topology; Petroleum; Routing; Switches;
Conference_Titel :
Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
Conference_Location :
Lafayette, LA
Print_ISBN :
0-7803-2428-5
DOI :
10.1109/MWSCAS.1994.519227
