DocumentCode
2983230
Title
Multi-finger power SiGe HBTs with non-uniform Spacing
Author
Dong-Yue, Jin ; Wan-Rong, Zhang ; Hong-Yun, Xie ; Yang, Wang
Author_Institution
Beijing Univ. of Technol., Beijing
fYear
2007
fDate
18-21 April 2007
Firstpage
1
Lastpage
4
Abstract
Based on a three-dimensional thermal-electrical model, non-uniform finger spacing power SiGe HBT was designed and fabricated. Experiment result shows that the peak temperature of non-uniform spacing SiGe HBT is Iowed by 22 K compared with that of uniform space HBT. For the same nonuniform spacing HBT, temperature non-uniformity among the fingers is improved obviously at different biases. The higher power dissipation PDC is, the better temperature improvement of non-uniform spacing HBT is. Because of the reducing of peak temperature, power SiGe HBTs with non-uniform Spacing can work at higher bias and has higher power handling capability.
Keywords
Ge-Si alloys; heterojunction bipolar transistors; power bipolar transistors; semiconductor materials; SiGe; multifinger power HBT; nonuniform spacing; power dissipation; power handling capability; three-dimensional thermal-electrical model; Contracts; Cutoff frequency; Electronic ballasts; Fingers; Germanium silicon alloys; Heterojunction bipolar transistors; Resistors; Silicon germanium; Space technology; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology, 2007. ICMMT '07. International Conference on
Conference_Location
Builin
Print_ISBN
1-4244-1049-5
Electronic_ISBN
1-4244-1049-5
Type
conf
DOI
10.1109/ICMMT.2007.381446
Filename
4266205
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