• DocumentCode
    2983303
  • Title

    High-Speed, Low-Temperature Integrated ZnO/Organic CMOS Circuits

  • Author

    Mourey, Devin A. ; Park, Sung Kyu ; Zhao, Dalong ; Sun, Jie ; Li, Yuanyuan ; Subramanian, Sankar ; Nelson, Shelby F. ; Levy, David H. ; Anthony, John E. ; Jackson, Thomas N.

  • Author_Institution
    Dept. of Mater. Sci. Eng., Penn State Univ., University Park, PA
  • fYear
    2008
  • fDate
    23-25 June 2008
  • Firstpage
    147
  • Lastpage
    148
  • Abstract
    The demand for low-cost, high mobility, thin-film technologies has generated particular interest in low-temperature- processed organic and metal oxide semiconductors. In addition, the development of CMOS circuits is likely to be important for low-power and battery-driven technologies. We have focused on ZnO, one of the most promising n- type semiconductors for thin-film application, but to date the formation of stable, high-mobility p-type at low temperatures has been challenging. We have previously demonstrated that by using a low-temperature (200degC) atmospheric pressure spatial ALD process, we can deposit uniform A1203 and ZnO films that result in high-mobility transistors (>15 cm2/V-s) and fast ring oscillators (<50 ns/stage). We have also demonstrated simple circuits using the high-mobility, solution-deposited, p-type organic semiconductor difluoro 5,ll-bis(triethylsilylethynyl) anthradithiophene (diF TES-ADT). We now report an integrated approach that combines these two technologies in a simple way to form low-temperature CMOS circuits.
  • Keywords
    CMOS integrated circuits; II-VI semiconductors; organic semiconductors; oscillators; thin film circuits; transistor circuits; wide band gap semiconductors; zinc compounds; ZnO; high-mobility transistors; integrated CMOS circuits; metal oxide semiconductors; n-type semiconductors; organic semiconductors; ring oscillators; thin-film technologies; CMOS technology; Chemical technology; Circuit testing; Electrodes; Gold; Organic semiconductors; Semiconductor thin films; Sun; Thin film circuits; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2008
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-1942-5
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2008.4800777
  • Filename
    4800777