• DocumentCode
    2983539
  • Title

    Lattice damages in quartz crystal blanks influence on the resonator properties and on the X-ray measurement

  • Author

    Seydel, E. ; Berger, H. ; Hildebrandt, G. ; Bradaczek, H.

  • Author_Institution
    Vita-Chem. GmbH, Berlin, Germany
  • fYear
    2004
  • fDate
    23-27 Aug. 2004
  • Firstpage
    109
  • Lastpage
    115
  • Abstract
    The temperature-frequency behavior of quartz crystals depends on the as-grown lattice defects in the volume as well as on process-induced surface damage. The influence of some special lattice distortions on the vibration behavior is calculated, assuming some simplified models. The degree of lattice damage is measured on blanks of different manufacturers and after different surface processing by means of the X-ray Θ-scan and Ω-scan methods. Single grains in the measuring area as well as reflection curve broadening and intensity changes are detected. It is necessary to check the lattice damage in blanks before further production steps in order to avoid crystal losses due to such damage. The curve-width and intensity measurement can be combined with automatic cut angle sorting, and the corresponding values can be used as additional sorting criteria.
  • Keywords
    crystal defects; crystal resonators; quartz; X-ray measurement; as-grown lattice defects; crystal resonator properties; process-induced surface damage; quartz crystal lattice damage; temperature-frequency behavior; Crystals; Distortion measurement; Frequency measurement; Lattices; Production; Reflection; Sorting; Surface resistance; Surface topography; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-8414-8
  • Type

    conf

  • DOI
    10.1109/FREQ.2004.1418437
  • Filename
    1418437