Title :
An element stamp implementation of active device models is for symbolic simulation
Author :
McCarville, Kevin S. ; Hassoun, Marwan M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
A vast majority of VLSI systems contain active components. Therefore, any circuit simulation tool must analyze solid-state elements. The nonlinear nature of these devices poses a number of significant problems in the development of simulation tools. The non-iterative nature of symbolic analysis present a number of additional problems in the analysis of nonlinear elements. This paper presents algorithms and an implementation of hierarchical symbolic active device models based on Modified Nodal Analysis and an extension of the element stamp concept. This element stamp implementation may be generalized to include any user defined subcircuit
Keywords :
VLSI; circuit analysis computing; integrated circuit modelling; nonlinear network analysis; symbol manipulation; VLSI circuits; active device models; algorithms; element stamp; hierarchical symbolic simulation; modified nodal analysis; nonlinear devices; solid-state elements; Admittance; Algorithm design and analysis; Brain modeling; Circuit simulation; Computational modeling; Computer simulation; Equations; MOSFET circuits; Solid state circuits; Transfer functions;
Conference_Titel :
Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
Conference_Location :
Lafayette, LA
Print_ISBN :
0-7803-2428-5
DOI :
10.1109/MWSCAS.1994.519390
