DocumentCode :
2984175
Title :
Magnetoresistance in MOSFETs with ferromagnetic MnAs source and drain contacts: Spin injection and transport in Si MOS channels
Author :
Nakane, R. ; Harada, T. ; Sugiura, K. ; Sugahara, S. ; Tanaka, M.
Author_Institution :
Dept. of Electron. Eng., Univ. of Tokyo, Tokyo
fYear :
2008
fDate :
23-25 June 2008
Firstpage :
227
Lastpage :
228
Abstract :
Summary form only given. Recently-proposed spin metal-oxide-semiconductor field-effect transistors (spin MOSFETs) are expected to be key devices for advancing the integrated circuit technology beyond the CMOS scaling. Towards the integration of spin MOSFETs with a CMOS platform, experimental demonstration and critical understanding of output characteristics are strongly needed. In this paper, we present the magnetoresistance and spin transport in MOSFETs with ferromagnetic MnAs source/drain (S/D) contacts.
Keywords :
CMOS integrated circuits; MOSFET; elemental semiconductors; ferromagnetic materials; magnetoresistance; manganese compounds; silicon; spin polarised transport; CMOS scaling; MOSFET; MnAs; Si; drain contacts; ferromagnetic source; ferromagnetic source/drain contacts; magnetoresistance; source contacts:; spin injection; spin metal-oxide-semiconductor field-effect transistors; spin transport; CMOS technology; Dielectric substrates; Integrated circuit technology; MOSFETs; Magnetic field measurement; Magnetic hysteresis; Magnetoresistance; Molecular beam epitaxial growth; Spin polarized transport; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2008
Conference_Location :
Santa Barbara, CA
ISSN :
1548-3770
Print_ISBN :
978-1-4244-1942-5
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2008.4800815
Filename :
4800815
Link To Document :
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