Title :
Piezo-controlled microwave frequency agile dielectric devices
Author :
Furman, Eugene ; Lanagan, Michael ; Golubeva, Irina ; Poplavko, Yuriy
Author_Institution :
Pennsylvania State Univ., University Park, PA, USA
Abstract :
A novel approach, utilizing piezoelectric actuators to control filters, resonators, and phase shifters with the minimum insertion loss, is described. Tunable, low-loss microwave devices can be fabricated using composite structures in which effective dielectric constant, εef, is controlled by piezoelectrically induced changes in the energy distribution within the devices. With this approach, a high degree of tunability is possible while utilizing high Q dielectrics. These devices usually consist of two dielectric parts with an air gap between them. This gap has to be arranged to provide the largest perturbation in the electromagnetic field. By means of a fast piezoelectric mini-actuator, the size of the air gap is changed and as a result, the εef can be tuned. This tuning is used for device control. Highly tunable (more than 20%) dielectric and metal ring resonators, as well as wide-band, low-loss phase shifters are realized experimentally.
Keywords :
circuit tuning; crystal resonators; dielectric resonators; microwave phase shifters; permittivity; piezoelectric actuators; air gap; composite structures; dielectric resonators; effective dielectric constant control; electromagnetic field perturbation; filter control; frequency agile dielectric devices; high Q dielectrics; low-loss microwave devices; metal ring resonators; microwave dielectric devices; piezo-controlled dielectric devices; piezoelectric actuators; piezoelectrically induced energy distribution changes; wideband low-loss phase shifters; Dielectric constant; Dielectric devices; Insertion loss; Microwave devices; Microwave filters; Microwave frequencies; Phase shifters; Piezoelectric actuators; Piezoelectric devices; Resonator filters;
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
Print_ISBN :
0-7803-8414-8
DOI :
10.1109/FREQ.2004.1418463