DocumentCode
2984263
Title
Study on Detecting Laser Interference Fringes Using Four-Quadrant Optoelectronic Detectors
Author
Shuzhen, Wang ; Tiebang, Xie ; Supinga, Chang
Author_Institution
Sch. of Mech. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2010
fDate
25-27 June 2010
Firstpage
2076
Lastpage
2079
Abstract
The spatial arrangement of symmetry four-quadrant optoelectronic detectors to detect laser interference fringes and the way to get a couple of quadrature signals are analyzed in this paper. The causes for measurement errors in detecting laser interference fringes using four-quadrant optoelectronic detectors are analyzed and a method combining hardware circuits and software is proposed to compensate measurement errors caused by the signal errors. The measurement error of laser interferometer using four quadrant photoelectric detectors is discuss using Michelson interferometer as an example and the measurement error formula is given. The laser interferometer using four-quadrant optoelectronic detectors has been successfully applied in the vertical scanning system developed in our laboratory. Experiments proved that the non-linear error of the laser interferometer is less than 0.05% and the actual effective resolution is less than 1nm.
Keywords
Michelson interferometers; measurement errors; optoelectronic devices; photodetectors; Michelson interferometer; laser interference fringes detection; laser interferometer; measurement error; optoelectronic detector; quadrant photoelectric detector; spatial arrangement; Detectors; Displacement measurement; Interference; Measurement by laser beam; Measurement errors; Optical interferometry; Semiconductor lasers; four-quadrant optoelectronic detectors; laser interference fringes; laser interferometer; measurement error;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-6880-5
Type
conf
DOI
10.1109/iCECE.2010.511
Filename
5630099
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