Title :
Least favorable distributions for robust quickest change detection
Author :
Unnikrishnan, Jayakrishnan ; Veeravalli, Venugopal V. ; Meyn, Sean
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fDate :
June 28 2009-July 3 2009
Abstract :
We study the problem of robust quickest change detection where the pre-change and post-change distributions are not known exactly but belong to known uncertainty classes of distributions. Both Bayesian and minimax versions of the quickest change detection problem are considered. When the uncertainty classes satisfy some specific conditions, we identify least favorable distributions (LFD´s) from the uncertainty classes, and show that the detection rule designed for the LFD´s is optimal in a minimax sense. The condition is similar to that required for the existence of LFD´s for the robust hypothesis testing problem studied by Huber.
Keywords :
minimax techniques; statistical distributions; change detection problem; detection rule; least favorable distribution; minimax version; postchange distribution; prechange distribution; robust quickest change detection; uncertainty classes; Bayesian methods; Change detection algorithms; Delay; Fault detection; Intrusion detection; Minimax techniques; Quality control; Robustness; System testing; Uncertainty;
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
DOI :
10.1109/ISIT.2009.5205661