• DocumentCode
    2984733
  • Title

    Evolution of the UWA solid nitrogen dual mode sapphire oscillator, JULIA

  • Author

    Anstie, J.D. ; Hartnett, J.G. ; Tobar, M.E. ; Ivanov, E.N. ; Stanwix, P.L.

  • Author_Institution
    Sch. of Phys., Univ. of Western Australia, Crawley, WA, Australia
  • fYear
    2004
  • fDate
    23-27 Aug. 2004
  • Firstpage
    386
  • Lastpage
    389
  • Abstract
    Low temperature, high precision sapphire oscillators rely on a turning point in mode frequency-temperature dependence at around 10 K. This, along with sapphire´s extremely low dielectric losses at microwave frequencies, allows fractional frequency stabilities on the order of 10-15. At higher temperatures, the lack of a turning point makes a single mode oscillator very sensitive to temperature fluctuations. By exciting two quasi-orthogonal whispering gallery (WG) modes, a turning point can be found in their beat frequency. A novel temperature control technique has been used to maintain the sapphire at the turning point temperature and a fractional frequency instability of 4.3×10-14 at 1 s integration time, dropping to 3.5×10-14 at 30 seconds integration time, has been measured.
  • Keywords
    cryogenic electronics; crystal oscillators; frequency stability; frequency standards; nitrogen; sapphire; temperature; temperature control; whispering gallery modes; beat frequency; fractional frequency instability; fractional frequency stability; frequency standard; frequency-temperature dependence; low dielectric losses; quasi-orthogonal whispering gallery modes; solid nitrogen dual mode sapphire oscillator; temperature control technique; turning point; Dielectric losses; Fluctuations; Microwave frequencies; Microwave oscillators; Nitrogen; Solids; Stability; Temperature dependence; Temperature sensors; Turning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-8414-8
  • Type

    conf

  • DOI
    10.1109/FREQ.2004.1418486
  • Filename
    1418486