DocumentCode
2984923
Title
Room-Temperature Polariton Laser
Author
Grandjean, Nicolas ; Christmann, Gabirel ; Feltin, Eric ; Carlin, Jean-François ; Altoukhov, Alexei ; Castiglia, Antonino ; Butté, Raphaël
Author_Institution
Inst. de Photonique et d´´Electron. Quantique, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne
fYear
2008
fDate
23-25 June 2008
Firstpage
305
Lastpage
306
Abstract
In this presentation, the main drawbacks of GaN based microcavities (MCs) are first pointed out. Achieving high quality factor MCs is a tough task because of intrinsic material properties like the lattice mismatch existing between GaN and AlN. To circumvent this issue, a different strategy based on lattice-matched AlInN alloy is adopted. Although difficult to grow, AlInN epitaxial layers can be successfully implemented to make high reflectivity distributed Bragg reflectors, and subsequently, high quality factor MCs. AlInN based MCs exhibit photonic disorder but record quality factor in excess of 6000 has been measured. Combining these MCs to low linewidth GaN QWs demonstrate SCR at 300 K with a Rabi splitting of 56 meV, the largest value reported so far for inorganic MCs. Optical pumping experiments performed on GaN bulk MCs have already shown the potential of III-V nitride semiconductors for polariton lasing. Recent results obtained on QW-MC indicate very low threshold lasing and polariton condensation in the lower polariton branch well. This is accompanied by the appearance of spontaneous linear polarization. The threshold is dependent on the detuning of the cavity mode with respect to the exciton mode. Finally, preliminary results obtained on electrical injection in these MC structures are presented.
Keywords
III-V semiconductors; Q-factor; aluminium compounds; excitons; gallium compounds; laser modes; microcavity lasers; optical pumping; polaritons; quantum well lasers; wide band gap semiconductors; AlInN; AlInN epitaxial; GaN; GaN based microcavities; Rabi splitting; cavity mode; distributed Bragg reflectors; electron volt energy 56 meV; exciton mode; lattice mismatch; optical pumping; polariton condensation; polariton laser; quality factor; reflectivity; room temperature; spontaneous linear polarization; temperature 293 K to 298 K; temperature 300 K; Distributed Bragg reflectors; Epitaxial layers; Gallium nitride; Lattices; Material properties; Microcavities; Optical pumping; Q factor; Reflectivity; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2008
Conference_Location
Santa Barbara, CA
ISSN
1548-3770
Print_ISBN
978-1-4244-1942-5
Electronic_ISBN
1548-3770
Type
conf
DOI
10.1109/DRC.2008.4800851
Filename
4800851
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