• DocumentCode
    2984923
  • Title

    Room-Temperature Polariton Laser

  • Author

    Grandjean, Nicolas ; Christmann, Gabirel ; Feltin, Eric ; Carlin, Jean-François ; Altoukhov, Alexei ; Castiglia, Antonino ; Butté, Raphaël

  • Author_Institution
    Inst. de Photonique et d´´Electron. Quantique, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne
  • fYear
    2008
  • fDate
    23-25 June 2008
  • Firstpage
    305
  • Lastpage
    306
  • Abstract
    In this presentation, the main drawbacks of GaN based microcavities (MCs) are first pointed out. Achieving high quality factor MCs is a tough task because of intrinsic material properties like the lattice mismatch existing between GaN and AlN. To circumvent this issue, a different strategy based on lattice-matched AlInN alloy is adopted. Although difficult to grow, AlInN epitaxial layers can be successfully implemented to make high reflectivity distributed Bragg reflectors, and subsequently, high quality factor MCs. AlInN based MCs exhibit photonic disorder but record quality factor in excess of 6000 has been measured. Combining these MCs to low linewidth GaN QWs demonstrate SCR at 300 K with a Rabi splitting of 56 meV, the largest value reported so far for inorganic MCs. Optical pumping experiments performed on GaN bulk MCs have already shown the potential of III-V nitride semiconductors for polariton lasing. Recent results obtained on QW-MC indicate very low threshold lasing and polariton condensation in the lower polariton branch well. This is accompanied by the appearance of spontaneous linear polarization. The threshold is dependent on the detuning of the cavity mode with respect to the exciton mode. Finally, preliminary results obtained on electrical injection in these MC structures are presented.
  • Keywords
    III-V semiconductors; Q-factor; aluminium compounds; excitons; gallium compounds; laser modes; microcavity lasers; optical pumping; polaritons; quantum well lasers; wide band gap semiconductors; AlInN; AlInN epitaxial; GaN; GaN based microcavities; Rabi splitting; cavity mode; distributed Bragg reflectors; electron volt energy 56 meV; exciton mode; lattice mismatch; optical pumping; polariton condensation; polariton laser; quality factor; reflectivity; room temperature; spontaneous linear polarization; temperature 293 K to 298 K; temperature 300 K; Distributed Bragg reflectors; Epitaxial layers; Gallium nitride; Lattices; Material properties; Microcavities; Optical pumping; Q factor; Reflectivity; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2008
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-1942-5
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2008.4800851
  • Filename
    4800851