• DocumentCode
    2985072
  • Title

    Optimal DSNR detector for ramp edges

  • Author

    Wang, Zhiqian ; Rao, K. Raghunath ; Ben-Arie, Jezekiel

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    23-26 Oct 1995
  • Firstpage
    153
  • Abstract
    In practical images, ideal step edges are actually transformed into exponential ramp edges, due to the general low pass filtering nature of imaging systems. This paper discusses the application of a newly developed expansion matching method for optimal ramp edge detection. Expansion matching optimizes a novel matching criterion called discriminative signal to noise ratio (DSNR). The DSNR criterion represents the desirable qualities of a sharp matching response with good localization and minimal off-center response. These requirements are consistent with the three criteria of signal-to-noise ratio, localization, and multiple response suppression used by Canny (1986) and others for optimal edge detection. We compare the optimal ramp edge detector based on DSNR with the ramp edge detector derived from Canny´s criteria. We show that our ramp edge detector performs better than the ramp detector obtained from Canny´s criteria in terms of DSNR and is relatively easier to derive for various amounts of noise and slopes
  • Keywords
    edge detection; filtering theory; image matching; DSNR detector; discriminative signal to noise ratio; expansion matching method; image processing; localization; low pass filtering; minimal off-center response; multiple response suppression; optimal ramp edge detection; ramp expansion filter; sharp matching response; Computer vision; Detectors; IIR filters; Image edge detection; Image restoration; Laboratories; Neural networks; Optical noise; Signal restoration; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 1995. Proceedings., International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-7310-9
  • Type

    conf

  • DOI
    10.1109/ICIP.1995.537437
  • Filename
    537437