• DocumentCode
    2985323
  • Title

    A bit-mapping classifier expert system in warranty selection

  • Author

    Deep, Ronald ; Czech, Donald R. ; Dizek, Steve G. ; Kennedy, Dave K.

  • Author_Institution
    Anal. Sci. Corp., Fairborn, OH, USA
  • fYear
    1988
  • fDate
    23-27 May 1988
  • Firstpage
    1222
  • Abstract
    A bit-mapped classifier system is described as a simple, effective method of distinguishing among classifiers based on descriptive features. Simple knowledge-representation techniques are used to encode a knowledge base in the domain of product performance agreements (warranties). The user interface is a simple display of features requiring a yes or no answer to indicate applicability. Feature selection is presented that ensures that each classifier can be distinguished from the others. A scoring routine based on features absent, features present, and `don´t care´ track the classifiers that best fit the specified description. After starting in a data-driven mode (forward chaining), the system switches to an hypothesis-driven mode and thus economizes on the acquisition of information. A discussion on sequential acquisition information is included to show the value of an expert system that can both forward and backward chain. The system establishes a threshold score for each classifier so that when sufficient points are accumulated, the winning classifier will be declared. An explanation of the selection is given by listing the features that the user designated
  • Keywords
    expert systems; military computing; backward chain; bit-mapped classifier system; data-driven mode; expert system; forward chaining; hypothesis-driven mode; knowledge-representation techniques; military application; product performance agreements; scoring routine; sequential acquisition information; warranty selection; Displays; Engines; Expert systems; Knowledge representation; Logic testing; Robustness; Switches; User interfaces; Warranties; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1988. NAECON 1988., Proceedings of the IEEE 1988 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1988.195161
  • Filename
    195161