DocumentCode
2985323
Title
A bit-mapping classifier expert system in warranty selection
Author
Deep, Ronald ; Czech, Donald R. ; Dizek, Steve G. ; Kennedy, Dave K.
Author_Institution
Anal. Sci. Corp., Fairborn, OH, USA
fYear
1988
fDate
23-27 May 1988
Firstpage
1222
Abstract
A bit-mapped classifier system is described as a simple, effective method of distinguishing among classifiers based on descriptive features. Simple knowledge-representation techniques are used to encode a knowledge base in the domain of product performance agreements (warranties). The user interface is a simple display of features requiring a yes or no answer to indicate applicability. Feature selection is presented that ensures that each classifier can be distinguished from the others. A scoring routine based on features absent, features present, and `don´t care´ track the classifiers that best fit the specified description. After starting in a data-driven mode (forward chaining), the system switches to an hypothesis-driven mode and thus economizes on the acquisition of information. A discussion on sequential acquisition information is included to show the value of an expert system that can both forward and backward chain. The system establishes a threshold score for each classifier so that when sufficient points are accumulated, the winning classifier will be declared. An explanation of the selection is given by listing the features that the user designated
Keywords
expert systems; military computing; backward chain; bit-mapped classifier system; data-driven mode; expert system; forward chaining; hypothesis-driven mode; knowledge-representation techniques; military application; product performance agreements; scoring routine; sequential acquisition information; warranty selection; Displays; Engines; Expert systems; Knowledge representation; Logic testing; Robustness; Switches; User interfaces; Warranties; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1988. NAECON 1988., Proceedings of the IEEE 1988 National
Conference_Location
Dayton, OH
Type
conf
DOI
10.1109/NAECON.1988.195161
Filename
195161
Link To Document