The development of a simple TRL microstrip calibration and test fixture suitable for measurements at cryogenic temperatures

Author

van Niekerk, C. ; Meyer, P.

Author_Institution

Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa

Volume

2

fYear

1996

fDate

24-27 Sep 1996

Firstpage

919

Abstract

The development of a TRL (thru/reflect/line) calibration and test fixture for vector network analyser measurements of microwave transistors at cryogenic temperatures, is presented. While capable of withstanding the severe environmental changes incurred by cooling to low temperatures, the fixture is simpler than similar existing fixtures. Measurements are presented to illustrate the repeatability of the fixture

Keywords

S-parameters; UHF measurement; calibration; circuit testing; cryogenic electronics; high electron mobility transistors; microstrip components; microwave measurement; microwave transistors; network analysers; test equipment; 1 to 6 GHz; Fujitsu FHR02FH; HEMT; cooling; cryogenic temperatures; low temperatures; microwave transistors; severe environmental changes; simple TRL microstrip calibration fixture; test fixture; thru/reflect/line fixture; vector network analyser measurements; Calibration; Contacts; Cooling; Cryogenics; Fixtures; Microstrip; Microwave measurements; Pins; Temperature; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AFRICON, 1996., IEEE AFRICON 4th

Conference_Location

Stellenbosch

Print_ISBN

0-7803-3019-6

Type

conf

DOI

10.1109/AFRCON.1996.563017

Filename

563017