Title :
A comparative study of compositional and structural properties of CdTe thin films prepared by different electroplating techniques
Author :
Paulson, P.D. ; Dutta, V. ; Singh, Chatar
Author_Institution :
Photovoltaic Lab., Centre for Energy Studies, Indian Inst. of Technol., New Delhi, India
Abstract :
The structural and compositional properties of CdTe films, deposited from an aqueous solution of CdSO4 and TeO by pulsed electrodeposition, potentiostatic and galvanostatic electrodeposition, have been studied. Polycrystalline films with a preferred ⟨111⟩ orientation are obtained in all techniques. However, films deposited by pulsed techniques show the higher intensity for ⟨111⟩ peak. An EDAX study shows that, for lower concentrations of CdSO4 in the electrolyte, pulsed films are more stoichiometric compared to films deposited by other two techniques
Keywords :
II-VI semiconductors; X-ray chemical analysis; X-ray diffraction; cadmium compounds; electroplated coatings; electroplating; semiconductor thin films; stoichiometry; CdSO4; CdTe; TeO; compositional properties; electrolyte; electroplating techniques; galvanostatic electrodeposition; polycrystalline films; potentiostatic electrodeposition; pulsed electrodeposition; stoichiometry; structural properties; thin film semiconductor; Frequency; Grain size; Laboratories; Optical films; Photovoltaic systems; Solar power generation; Tellurium; Transistors; Tribology; X-ray scattering;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.519968
