DocumentCode
2985996
Title
Changes in defects under external influence in langasite crystals
Author
Dubovskiy, A. ; Domoroshchina, E. ; Kuz´micheva, G. ; Semenkovich, G.
Author_Institution
Russian Res. Inst. for the Synthesis of Minerals, Alexandrov, Russia
fYear
2004
fDate
23-27 Aug. 2004
Firstpage
642
Lastpage
645
Abstract
In the growing process of multicomponent piezocrystalline crystals (La3Ga5SiO14), even minor deflections from optimal growth conditions lead to changes in defect concentration and, consequently, to changes in the properties of the whole crystal. A comprehensive study of the crystalline lattice using X-ray structural analysis and optical spectroscopy shows the formation of point defects - vacancies for oxygen and lanthanum, substitution of gallium by silicon and vice versa - that correspond with quasichemical reactions. In the spectrum of optical transmission, the band 35000 cm-1 is connected with a lanthanum vacancy (VLA´´´), and bands 28500, 26000, 25000 cm-1 with oxygen vacancies in three positions. Under γ-radiation to a dose of 200 C/kg, optical spectra are observed to increase absorption in the region 40000-30000 cm-1, but which disappear at the annealing temperature of 300°C. The value of absorption at frequency 40000 cm-1 can be used for the primary crystal quality assessment.
Keywords
annealing; crystal defects; crystal structure; gallium compounds; gamma-ray effects; lanthanum compounds; light absorption; light transmission; piezoelectric materials; silicon compounds; 200 C/kg; 25000 to 40000 cm-1; 300 C; X-ray structural analysis; annealing temperature; crystal quality assessment; crystalline lattice; defect concentration; langasite crystals; lanthanum vacancies; multicomponent piezocrystalline crystals; optical absorption; optical spectra; optical spectroscopy; optical transmission; optimal growth conditions; oxygen vacancies; point defects; quasichemical reactions; substitution; Annealing; Crystallization; Crystals; Electromagnetic wave absorption; Gallium; Lanthanum; Lattices; Silicon; Spectroscopy; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
ISSN
1075-6787
Print_ISBN
0-7803-8414-8
Type
conf
DOI
10.1109/FREQ.2004.1418538
Filename
1418538
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