Point defects in quartz crystals and their radiation response - a review [quartz resonator applications]

Author

Bahadur, Harish

Author_Institution

Nat. Phys. Lab., New Delhi, India

fYear

2004

fDate

23-27 Aug. 2004

Firstpage

651

Lastpage

659

Abstract

A short review of Al-related point deflects and their radiation effects is presented. These defects exhibit spectroscopic signals which are monitored by a variety of experimental techniques. This discussion is useful to prospective researchers in the area of precision quartz resonators for frequency control in aerospace applications. Irradiation of quartz crystals at 77 K before and after irradiation at 300 K coupled with sweeping can be used for estimating the role of various point defects for their contribution in estimating the frequency offsets in quartz crystals in a radiation environment.

Keywords

crystal resonators; point defects; radiation hardening (electronics); 300 K; 77 K; Al; SiO₂; aerospace frequency control; crystal irradiation; electrodiffusion; frequency offsets; ionizing radiation effects; precision quartz resonators; quartz crystal point defects; quartz crystal radiation response; radiation environment; radiation hardening; sweeping; Application software; Crystals; Frequency control; Frequency estimation; Impurities; Optical filters; Optical resonators; Optical sensors; Optical signal processing; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International

ISSN

1075-6787

Print_ISBN

0-7803-8414-8

Type

conf

DOI

10.1109/FREQ.2004.1418540

Filename

1418540