• DocumentCode
    2986169
  • Title

    Adaptive Signal Scaling Driven Critical Path Modulation for Low Power Baseband OFDM Processors

  • Author

    Nisar, Muhammad M. ; Senguttuvan, Rajarajan ; Chatterjee, Abhijit

  • Author_Institution
    Georgia Inst. of Technol., Atlanta
  • fYear
    2008
  • fDate
    4-8 Jan. 2008
  • Firstpage
    71
  • Lastpage
    76
  • Abstract
    Modern wireless communication systems are designed for worst-case channel noise and interference conditions. This results in circuits that over-perform and consume more power than necessary most of the time when channel conditions are not worst-case. In this paper, we propose a power savings methodology that allows "graceful degradation" of baseband system performance when channel conditions are good without compromising overall bit-error rate. This adaptation is achieved by "dynamically modulating the active circuit critical paths via signal scaling" and by simultaneously modulating the supply voltage of the baseband signal processing circuitry. The proposed approach uses continuous monitoring of the error vector magnitude (EVM) of the demodulated signal to drive the adaptation procedure. The proposed architecture can reduce power consumption in the baseband processor of an OFDM receiver by as much as 30%. As opposed to other schemes, the proposed technique requires no modification of existing signal processing hardware.
  • Keywords
    OFDM modulation; active networks; adaptive signal processing; digital signal processing chips; error statistics; radio receivers; radiocommunication; telecommunication power supplies; OFDM receiver; active circuit critical paths; adaptive signal scaling; baseband signal processing circuitry; bit-error rate; channel noise; continuous monitoring; critical path modulation; demodulated signals; error vector magnitude; interference conditions; low power baseband OFDM processors; power consumption reduction; power savings methodology; supply voltage modulation; wireless communication systems; Active circuits; Baseband; Bit error rate; Circuit noise; Degradation; Interference; OFDM modulation; Signal processing; System performance; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2008. VLSID 2008. 21st International Conference on
  • Conference_Location
    Hyderabad
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-3083-4
  • Type

    conf

  • DOI
    10.1109/VLSI.2008.107
  • Filename
    4450483