Title :
Quantum efficiencies exceeding unity in amorphous silicon solar cells
Author :
Vanmaekelbergh, D. ; van de Lagemaat, Jao ; Schropp, R.E.I.
Author_Institution :
Debye Inst., Utrecht Univ., Netherlands
Abstract :
The experimental observation of internal quantum efficiencies above unity in crystalline silicon solar cells has brought up the question whether the generation of multiple electron/hole pairs also has to be taken into consideration in solar cells based on direct gap amorphous semiconductors. To study photogenerated carrier dynamics, we have applied intensity modulated photocurrent spectroscopy (IMPS) to hydrogenated amorphous silicon p-i-n solar cells. In the reverse voltage bias region at low illumination intensities it has been observed that the low frequency limit of the AC quantum yield Y increases significantly above unity with decreasing light intensity, indicating that more than one electron per photon is detected in the external circuit. This phenomenon can be explained by considering trapping and thermal emission of photogenerated carriers at intragap amphoteric dangling bond defect centers
Keywords :
amorphous semiconductors; dangling bonds; elemental semiconductors; hydrogen; minority carriers; photoconductivity; silicon; solar cells; spectroscopy; AC quantum yield; Si:H; a-Si:H solar cells; amorphous silicon solar cells; direct gap amorphous semiconductors; intensity modulated photocurrent spectroscopy; internal quantum efficiencies; intragap amphoteric dangling bond defect centers; low illumination intensities; multiple electron/hole pairs generation; p-i-n solar cells; photogenerated carrier dynamics; reverse voltage bias region; thermal emission; trapping; Amorphous semiconductors; Amorphous silicon; Charge carrier processes; Crystallization; Intensity modulation; PIN photodiodes; Photoconductivity; Photovoltaic cells; Solar power generation; Spectroscopy;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520034