• DocumentCode
    2986777
  • Title

    An Optimal Multi-Functional Unit Dynamic Instruction Selection Logic at Submicron Technologies

  • Author

    Bennett, Terrell ; Sangireddy, Rama

  • Author_Institution
    Univ. of Texas at Dallas, Richardson
  • fYear
    2008
  • fDate
    4-8 Jan. 2008
  • Firstpage
    267
  • Lastpage
    272
  • Abstract
    As the technology scales, reduction in transistor size creates many opportunities for increased circuit capabilities in reduced chip area. In modern wide-issue processors, performance of the processor is directly impacted by the time delay complexity of the dynamic scheduling logic. In this paper, we analyze the scaling of time delay of instruction select logic at the submicron technologies, and also present novel designs that provide a single selection tree for two similar functional units. The designs are based on a tree structure using arbiter cells of two and four inputs which can handle one or two functional units. The effects of technology and design decisions are shown based on simulations using four submicron technologies. The delays in the select logic trees are shown to decrease by an average of 60% from 130 nm technology to 45 nm technology when servicing a single functional unit. The double grant arbiter cells are shown to build a tree that will serve multiple functional units simultaneously with 65% lesser delay as compared to multiple single-grant trees1.
  • Keywords
    logic circuits; logic design; microprocessor chips; trees (mathematics); dynamic scheduling logic; multifunctional unit dynamic instruction selection logic; submicron technologies; submicron technology; time delay; transistor size; tree structure; CMOS logic circuits; Delay effects; Dynamic scheduling; Frequency; Logic circuits; Logic design; Out of order; Processor scheduling; Tree data structures; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2008. VLSID 2008. 21st International Conference on
  • Conference_Location
    Hyderabad
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-3083-4
  • Type

    conf

  • DOI
    10.1109/VLSI.2008.55
  • Filename
    4450513