• DocumentCode
    2986980
  • Title

    Fully Depleted SOI RF Switch with Dynamic Biasing

  • Author

    Chen, C.L. ; Chen, C.K. ; Wyatt, P.W. ; Knecht, J.M. ; Yost, D.-R. ; Gouker, P.M. ; Healey, P.D. ; Keast, C.L.

  • Author_Institution
    Massachusetts Inst. of Technol., Lexington
  • fYear
    2007
  • fDate
    3-5 June 2007
  • Firstpage
    175
  • Lastpage
    178
  • Abstract
    RF switches based on fully depleted (FD) SOI technology are reported for the first time. In a novel biasing circuit, the conventional bias resistor at the gate of the series MOSFET switch is replaced with another FET, which functions as a variable resistor and presents different resistance optimal for the on-and off-state. The low parasitic capacitance of FDSOI improved the switch performance and the dynamic biasing further increased the saturated power. At 5 GHz, a single-pole double-throw (SPDT) switch with integrated control circuits has 0.75-dB of insertion loss and 39-dB of isolation. The 1-dB-compression power of this dynamically biased SPDT switch approaches 2 W at 5 GHz.
  • Keywords
    field effect transistor switches; radiofrequency integrated circuits; silicon-on-insulator; MOSFET switch; SPDT; dynamic biasing; fully depleted SOI RF switch; integrated control circuits; silicon-on-insulator; single-pole double-throw switch; Circuit testing; FETs; Insertion loss; MOSFET circuits; Parasitic capacitance; Radio frequency; Resistors; Silicon on insulator technology; Switches; Switching circuits; RF switch; SOI; Si RF integrated circuit; fully depleted SOI; mixed signal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1529-2517
  • Print_ISBN
    1-4244-0530-0
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2007.380859
  • Filename
    4266407