• DocumentCode
    2987109
  • Title

    Reliability and capacity: a spatial load forecasting method for a performance based regulatory environment

  • Author

    Brown, R.E. ; Hanson, A.P. ; Marshall, M.W. ; Willis, H.L.

  • Author_Institution
    Electr. Syst. Technol. Inst., ABB Power T&D Co. Inc., Raleigh, NC, USA
  • fYear
    1999
  • fDate
    36342
  • Firstpage
    139
  • Lastpage
    144
  • Abstract
    This paper presents a load forecasting method that yields results useful for substation and feeder planning while providing a conceptually simple framework for data entry. The method couples existing system and load knowledge, load growth patterns and horizon year information to permit development of multiple scenarios for spatial load growth progression from existing land use patterns. In addition, the method allows for an intimate connection between the spatial load forecasting model, a circuit model, and a reliability model. This results in a fully integrated planning tool where the impact of load growth on both electrical performance and reliability performance can be quantified. This type of analysis will be critical for utilities subject to performance based rates
  • Keywords
    load forecasting; power distribution planning; power distribution reliability; capacity; circuit model; data entry; electrical performance; feeder planning; horizon year information; land use patterns; load growth impact; load growth patterns; load knowledge; performance based rates; performance based regulatory environment; reliability; reliability model; reliability performance; spatial load forecasting method; spatial load growth progression; substation planning; Coupling circuits; Integrated circuit reliability; Land use planning; Load forecasting; Load modeling; Performance analysis; Power system planning; Power system reliability; Predictive models; Substations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Industry Computer Applications, 1999. PICA '99. Proceedings of the 21st 1999 IEEE International Conference
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-5478-8
  • Type

    conf

  • DOI
    10.1109/PICA.1999.779396
  • Filename
    779396