Title :
Hybrid Probabilistic Relational Models for System Quality Analysis
Author :
Närman, Per ; Buschle, Markus ; König, Johan ; Johnson, Pontus
Author_Institution :
Ind. Inf. & Control Syst., R. Inst. of Technol. (KTH), Stockholm, Sweden
Abstract :
The formalism Probabilistic Relational Models (PRM) couples discrete Bayesian Networks with a modeling formalism similar to UML class diagrams and has been used for architecture analysis. PRMs are well-suited to perform architecture analysis with respect to system qualities since they support both modeling and analysis within the same formalism. A particular strength of PRMs is the ability to perform meaningful analysis of domains where there is a high level of uncertainty, as is often the case when performing system quality analysis. However, the use of discrete Bayesian networks in PRMs complicates the analysis of continuous phenomena. The main contribution of this paper is the Hybrid Probabilistic Relational Models (HPRM) formalism which extends PRMs to enable continuous analysis thus extending the applicability for architecture analysis and especially for trade-off analysis of system qualities. HPRMs use hybrid Bayesian networks which allow combinations of discrete and continuous variables. In addition to presenting the HPRM formalism, the paper contains an example which details the use of HPRMs for architecture trade-off analysis.
Keywords :
Unified Modeling Language; belief networks; program diagnostics; software architecture; software quality; HPRM formalism; UML class diagrams; architecture analysis; discrete Bayesian networks; hybrid probabilistic relational model; system quality analysis; trade-off analysis; Analytical models; Availability; Bayesian methods; Probabilistic logic; Probability distribution; Time factors; Unified modeling language; Enterprise Architecture; Hybrid Probabilistic Relational Models; Performance assessment; Probabilistic Relational Models; System Quality Analysis;
Conference_Titel :
Enterprise Distributed Object Computing Conference (EDOC), 2010 14th IEEE International
Conference_Location :
Vitoria
Print_ISBN :
978-1-4244-7966-5
DOI :
10.1109/EDOC.2010.29