• DocumentCode
    2987411
  • Title

    Experimental study of the conducting spots in aluminium contact interfaces

  • Author

    Runde, M. ; Hodne, E. ; Totdal, B.

  • Author_Institution
    Norwegian Res. Inst. of Electr. Supply, Trondheim, Norway
  • fYear
    1989
  • fDate
    18-20 Sep 1989
  • Firstpage
    205
  • Lastpage
    211
  • Abstract
    The electrical properties of a stationary electric contact are closely related to phenomena occurring in the very small contact spots of the interface. Contact spots in aluminium-aluminium interfaces that have passed heavy direct currents have been studied. The size, shape, and appearance of the spot fractures were found to be correlated to the surface roughness and to the recorded voltage and resistance characteristics. Rough contact surfaces caused irregularly shaped contact spots to develop, while high and unstable resistances were always associated with large contact spots. The latter observation indicates that the electrical conductivity of the contact spots has been reduced by the electrical stresses: the spots have aged. Aging of a contact point leads to the formation of new current paths through the interface, in the vicinity of the original ones. The aging rate increases rapidly with increasing voltage drop across the interface
  • Keywords
    ageing; aluminium; contact resistance; electrical contacts; reliability; aging rate; conducting spots; contact spot appearance; contact spot shape; contact spot size; electrical conductivity; electrical properties; heavy direct currents; large contact spots; resistance characteristics; small contact spots; spot fractures; stationary electric contact; surface roughness; unstable resistances; voltage; voltage drop; Aging; Aluminum; Contacts; Electric resistance; Rough surfaces; Shape; Surface cracks; Surface resistance; Surface roughness; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1989., Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/HOLM.1989.77941
  • Filename
    77941