DocumentCode
2987531
Title
Apparent Positive Carrier Conduction In SiO/sub 2/ Films And Implications For Mosfet Scaling
Author
Harrell, W.R. ; Frey, J.
Author_Institution
University of Maryland
fYear
1992
fDate
21-24 June 1992
Keywords
Conductive films; Current measurement; Electron emission; Electron traps; Equations; Hot carrier effects; Hot carriers; MOS capacitors; MOSFET circuits; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1992. Digest. 50th Annual
Conference_Location
Cambridge, MA, USA
Type
conf
DOI
10.1109/DRC.1992.671906
Filename
671906
Link To Document