DocumentCode
2987568
Title
A Jitter Reduction Circuit Using Autocorrelation for Phase-Locked Loops and Serializer-Deserializer (SERDES) Circuits
Author
Venkatanarayanan, Hari V. ; Bushnell, Michael L.
Author_Institution
Rutgers Univ., Piscataway
fYear
2008
fDate
4-8 Jan. 2008
Firstpage
581
Lastpage
588
Abstract
A new jitter reduction circuit is proposed for reducing the timing jitter in a serializer-deserializer (SERDES). Instead of using elaborate hardware to calculate the jitter, we use the jittered signal´s autocorrelation to remove the jitter. The motivation for this work was to provide a reduced jitter phase-locked loop (PLL), so that incorporating a built-in self-testing (BIST) mechanism for PLL´s and SERDES would be simplified. The technique involves transmit and receive side jitter reducer pulse shaping circuits made of only 14 and 20 transistors, respectively. They reduce the jitter in the clock generated by the PLL at the transmit side, and the jitter between the recovered clock and the serial data at the receive side. The jitter reducers are designed in 70 nm Berkeley Predictive process models and tested with various types of input jitter. In the case of the transmit side, the peak-to-peak random jitter (RJ) is reduced, on average, by 45.51% and also the average transmit and receive side RMS jitter is reduced, on average, by 62.24% and 35.88%, respectively. The bit-error rate (BER) of the SERDES computed probabilistically is improved from 8.3 times 10-2 to 6.44 times 10-20, for input RMS periodic jitter (PJ) of 71.77 ps. The BER for the PCI express bus must be les 1 times 10-12.
Keywords
built-in self test; error statistics; phase locked loops; timing jitter; PCI express bus; SERDES circuits; bit-error rate; built-in self-testing mechanism; jitter reduction circuit; jittered signal autocorrelation; peak-to-peak random jitter; phase-locked loops; predictive process models; serializer-deserializer circuits; timing jitter; Autocorrelation; Bit error rate; Built-in self-test; Circuits; Clocks; Hardware; Phase locked loops; Predictive models; Pulse shaping methods; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location
Hyderabad
ISSN
1063-9667
Print_ISBN
0-7695-3083-4
Type
conf
DOI
10.1109/VLSI.2008.118
Filename
4450561
Link To Document