• DocumentCode
    2987592
  • Title

    Behavioral Modeling of a CMOS Compatible High Precision MEMS Based Electron Tunneling Accelerometer

  • Author

    Bhattacharyya, T.K. ; Ghosh, Anandaroop

  • Author_Institution
    Indian Inst. of Technol., Kharagpur
  • fYear
    2008
  • fDate
    4-8 Jan. 2008
  • Firstpage
    595
  • Lastpage
    600
  • Abstract
    The paper presents a comprehensive behavioral model of a high precision tunneling accelerometer. Design and optimization of the silicon based tunneling has also been reported in this work. The accelerometer is CMOS compatible and has actuation voltage within CMOS bias levels. The proposed structure uniquely combines the electron tunneling based sensing and capacitive actuation. A feedback controller is designed to measure the acceleration under constant gap mode of operation. The full dynamic range of operation is 1 mug to 200 mug with a resolution in the order of nano-g. The cross-axis sensitivity is less than 1% and the shock survivability is 10 g for a 10 ms shock with 0.1 ms rise time. The Brownian noise floor of the system has also been studied and the squeeze film damping effects on the system has been shown.
  • Keywords
    CMOS integrated circuits; accelerometers; damping; electrostatic actuators; feedback; integrated circuit modelling; microsensors; tunnelling; Brownian noise floor; CMOS bias levels; CMOS compatible high precision MEMS; acceleration measurement; actuation voltage; capacitive actuation; constant gap mode operation; cross-axis sensitivity; electron tunneling accelerometer behavioral modeling; electron tunneling based sensing; feedback controller design; shock survivability; silicon based tunneling; squeeze film damping effects; Accelerometers; Adaptive control; Design optimization; Electric shock; Electrons; Micromechanical devices; Semiconductor device modeling; Silicon; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2008. VLSID 2008. 21st International Conference on
  • Conference_Location
    Hyderabad
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-3083-4
  • Type

    conf

  • DOI
    10.1109/VLSI.2008.60
  • Filename
    4450563