Title :
A Sub 1V CMOS LNA dedicated to 802.11b/g applications with self-test & high reliability capabilities
Author :
Cimino, Mikael ; Lapuyade, Hervé ; De Matos, Magali ; Taris, Thierry ; Deval, Yann ; Bégueret, Jean Baptiste
Author_Institution :
Univ. of Bordeaux 1, Talence
Abstract :
A low noise amplifier designed in a 0.13 mum CMOS technology, which has self-test and high reliability capabilities, is presented. Such a LNA could be used in the design of front-end of critical nodes in wireless local area networks to ensure the data transmission. The test of the LNA is based on a built-in self test methodology that permits to monitor its behavior and its reliability is ensured by the use of redundancies. The LNA works under a 0.9 V supply voltage and the test chip has characteristics suitable for 802.11 b/g applications. Parametric faults are injected and detected that demonstrate the efficiency of the BIST circuitry. Switching on each redundant block has proven that the LNA keeps its performances.
Keywords :
CMOS integrated circuits; UHF integrated circuits; VLSI; application specific integrated circuits; integrated circuit design; integrated circuit reliability; integrated circuit testing; low noise amplifiers; wireless LAN; BIST circuitry; CMOS LNA; CMOS VLSI; CMOS technology; RF low noise amplifier; built-in self test methodology; data transmission; parametric faults; reliability; self-test capability; size 0.13 mum; wireless local area networks; Automatic testing; Built-in self-test; CMOS technology; Circuit testing; Data communication; Low-noise amplifiers; Monitoring; Redundancy; Voltage; Wireless LAN; Built-In Current Sensor; Built-In Self Test; CMOS VLSI; RF Low Noise Amplifier; low voltage; reliable design;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0530-0
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2007.380897
