Title :
A reliability comparison of single and double rings
Author :
Lin, Nanchang ; Silio, Charles B., Jr.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Abstract :
A comparison is made of the reliability of several fault-tolerant single- and double-ring networks. The reliability measure adopted is the probability that all operative nodes can communicate (P[C ]). Although computing P[C] has been proven an NP-hard problem for general networks, closed-form expressions for P [C] are presented for several ring network structures. These networks include (1) the basic single ring, (2) a single ring with nodal bypass switches, (3) a star-shaped ring, (4) a dual ring, (5) a double ring, (6) a double ring with bypass switches, and (7) a double ring with both nodal-bypass and link-reversing switches. The expressions for these seven rings are evaluated under varying failure-probability assumptions, and reliability comparisons are made
Keywords :
fault tolerant computing; reliability theory; switching theory; telecommunication networks; basic single ring; double ring; dual ring; fault tolerant ring networks; link-reversing switches; nodal bypass switches; probability; reliability comparison; single ring networks; star-shaped ring; Communication switching; Computer crime; Computer networks; Educational institutions; Fault tolerance; NP-hard problem; Network topology; Optical fibers; Optical switches; Telecommunication network reliability;
Conference_Titel :
INFOCOM '90, Ninth Annual Joint Conference of the IEEE Computer and Communication Societies. The Multiple Facets of Integration. Proceedings, IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-2049-8
DOI :
10.1109/INFCOM.1990.91288
