Title :
Decomposition-based model parameter extraction
Author :
Opalska, Katarzyna ; Opalski, Leszek
Author_Institution :
Inst. of Electron. Fundamentals, Warsaw Univ. of Technol., Poland
fDate :
30 Apr-3 May 1995
Abstract :
This paper presents a decomposition-based approach to model parameter extraction. The new parameter extraction technique combines virtues of sequential regression and full optimization approaches. Extraction of the SPICE2 BJT model parameters illustrates concepts and advantages of the proposed method
Keywords :
SPICE; bipolar transistors; electronic engineering computing; optimisation; semiconductor device models; SPICE2 BJT model parameters; decomposition-based approach; model parameter extraction; optimization; sequential regression; Convergence; Curve fitting; Data mining; Equations; Error correction; Linear regression; Parameter extraction; Sensitivity analysis;
Conference_Titel :
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2570-2
DOI :
10.1109/ISCAS.1995.520410
