• DocumentCode
    298858
  • Title

    Decomposition-based model parameter extraction

  • Author

    Opalska, Katarzyna ; Opalski, Leszek

  • Author_Institution
    Inst. of Electron. Fundamentals, Warsaw Univ. of Technol., Poland
  • Volume
    2
  • fYear
    1995
  • fDate
    30 Apr-3 May 1995
  • Firstpage
    1404
  • Abstract
    This paper presents a decomposition-based approach to model parameter extraction. The new parameter extraction technique combines virtues of sequential regression and full optimization approaches. Extraction of the SPICE2 BJT model parameters illustrates concepts and advantages of the proposed method
  • Keywords
    SPICE; bipolar transistors; electronic engineering computing; optimisation; semiconductor device models; SPICE2 BJT model parameters; decomposition-based approach; model parameter extraction; optimization; sequential regression; Convergence; Curve fitting; Data mining; Equations; Error correction; Linear regression; Parameter extraction; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-2570-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.1995.520410
  • Filename
    520410
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=298858