Title :
Performance of wavelet shrinkage maximum likelihood estimator in 3GPP’s spatial channel model based on OFDM system
Author :
Yan, Lei ; Dai, Jufeng ; Sun, Shanlin ; Fu, Jinlin
Author_Institution :
Telecommun. Res. Lab., Tianjin Univ., Tianjin
Abstract :
This paper deals with the estimation of the channel impulse response (CTR) of spatial channel model (SCM) in the third generation partnership project (3GPP) based on orthogonal frequency division multiplexing (OFDM) system. Maximum likelihood estimation (MLE) contains intrinsic noise, and Bayesian minimum mean square error estimation (MMSEE) is expected to have better performance as it exploits prior information about the CIR, which results difficulty of implementation in practice. We propose a new estimator which processes MLE with wavelet shrinkage algorithm. Filtered by quantization and reconstruction functions, the estimate becomes more accurate than MLE. Simulation results validate that wavelet shrinkage maximum likelihood estimation (WMLE) outperforms MLE in terms of accuracy and bit error rate (BER) without prior channel information.
Keywords :
3G mobile communication; Bayes methods; OFDM modulation; filtering theory; least mean squares methods; maximum likelihood estimation; quantisation (signal); wavelet transforms; wireless channels; 3GPP spatial channel model; Bayesian minimum mean square error estimation; OFDM system; channel impulse response; filtering theory; intrinsic noise; orthogonal frequency division multiplexing; quantization function; reconstruction function; third generation partnership project; wavelet shrinkage maximum likelihood estimation; Maximum likelihood estimation; OFDM; Pattern analysis; Pattern recognition; Wavelet analysis; OFDM; maximum likelihood estimate; minimum mean square error estimate; spatial channel model; wavelet shrinkage algorithm;
Conference_Titel :
Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2238-8
Electronic_ISBN :
978-1-4244-2239-5
DOI :
10.1109/ICWAPR.2008.4635854