DocumentCode
2989108
Title
Substrate Coupling Effect under Various Noise Injection Topologies in LC-Voltage Controlled Oscillator
Author
Wang, Shen-Sz ; Wu, Yu-Chen ; Hsu, Shawn S H ; Chan, Chih-Yuan
Author_Institution
Nat. Tsing Hua Univ., Hsinchu
fYear
2007
fDate
3-5 June 2007
Firstpage
705
Lastpage
708
Abstract
Impact of substrate noise coupling on a wideband VCO (5.6 to 7.5 GHz) was investigated using different noise injection topologies. Measured results indicated that IM2 increased by ~ 5 to 7 dB and IM3 by ~ 6 to 10 dB when the inductor guard ring floated. In addition, the noise at high frequencies still degraded the VCO performance even not injected directly to the substrate. The observed trends were modeled and explained by a simple physical-based resistive network together with the oxide layer capacitors successfully.
Keywords
capacitors; voltage-controlled oscillators; LC-voltage controlled oscillator; noise injection topology; oxide layer capacitor; physical-based resistive network; substrate coupling effect; wideband VCO; CMOS technology; Circuit noise; Circuit topology; Coupling circuits; Frequency; Inductors; Integrated circuit noise; Network topology; Noise measurement; Voltage-controlled oscillators; Noise coupling; RF CMOS; VCO;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
Conference_Location
Honolulu, HI
ISSN
1529-2517
Print_ISBN
1-4244-0530-0
Electronic_ISBN
1529-2517
Type
conf
DOI
10.1109/RFIC.2007.380980
Filename
4266528
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