DocumentCode :
2989108
Title :
Substrate Coupling Effect under Various Noise Injection Topologies in LC-Voltage Controlled Oscillator
Author :
Wang, Shen-Sz ; Wu, Yu-Chen ; Hsu, Shawn S H ; Chan, Chih-Yuan
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu
fYear :
2007
fDate :
3-5 June 2007
Firstpage :
705
Lastpage :
708
Abstract :
Impact of substrate noise coupling on a wideband VCO (5.6 to 7.5 GHz) was investigated using different noise injection topologies. Measured results indicated that IM2 increased by ~ 5 to 7 dB and IM3 by ~ 6 to 10 dB when the inductor guard ring floated. In addition, the noise at high frequencies still degraded the VCO performance even not injected directly to the substrate. The observed trends were modeled and explained by a simple physical-based resistive network together with the oxide layer capacitors successfully.
Keywords :
capacitors; voltage-controlled oscillators; LC-voltage controlled oscillator; noise injection topology; oxide layer capacitor; physical-based resistive network; substrate coupling effect; wideband VCO; CMOS technology; Circuit noise; Circuit topology; Coupling circuits; Frequency; Inductors; Integrated circuit noise; Network topology; Noise measurement; Voltage-controlled oscillators; Noise coupling; RF CMOS; VCO;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
ISSN :
1529-2517
Print_ISBN :
1-4244-0530-0
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2007.380980
Filename :
4266528
Link To Document :
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