• DocumentCode
    2989841
  • Title

    Deformed statistics formulation of the information bottleneck method

  • Author

    Venkatesan, R.C. ; Plastino, Alexandre

  • Author_Institution
    Syst. Res. Corp., Pune, India
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    1323
  • Lastpage
    1327
  • Abstract
    The theoretical basis for a candidate variational principle for the information bottleneck (IB) method is formulated within the ambit of the generalized nonadditive statistics of Tsallis. Given a nonadditivity parameter q, the role of the additive duality of nonadditive statistics (q* = 2 - q ) in relating Tsallis entropies for ranges of the nonadditivity parameter q < 1 and q > 1 is described. Defining X, Xtilde, and Y to be the source alphabet, the compressed reproduction alphabet, and, the relevance variable respectively, it is demonstrated that minimization of a generalized IB (gIB) Lagrangian defined in terms of the nonadditivity parameter q* self-consistently yields the nonadditive effective distortion measure to be the q-deformed generalized Kullback-Leibler divergence: DK-L q[p(Y|X)parp(Y|Xtilde)]. This result is achieved without enforcing any a-priori assumptions. Next, it is proven that the q*-deformed nonadditive free energy of the system is non-negative and convex. Finally, the update equations for the gIB method are derived. These results generalize critical features of the IB method to the case of Tsallis statistics.
  • Keywords
    distortion; duality (mathematics); entropy; statistical analysis; Kullback-Leibler divergence; Tsallis entropy; candidate variational principle; deformed statistics formulation; duality; information bottleneck method; nonadditive effective distortion measure; relevance variable; Councils; Data compression; Distortion measurement; Entropy; Equations; Lagrangian functions; Physics; Q measurement; Rate-distortion; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2009. ISIT 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4312-3
  • Electronic_ISBN
    978-1-4244-4313-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2009.5205932
  • Filename
    5205932