• DocumentCode
    2989970
  • Title

    Fluid flow in micron and submicron size channels

  • Author

    Harley, John ; Bau, Haim ; Zemel, Jay N. ; Dominko, Vladimir

  • Author_Institution
    Pennsylvania Univ., Philadelphia, PA, USA
  • fYear
    1989
  • fDate
    20-22 Feb 1989
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    Experiments on flow in micron- and submicron-size channels were conducted. The long-term objectives of the study were to investigate: (1) the length scales at which continuum assumptions break down; (2) whether the Navier-Stokes (N-S) equations adequately model the fluid flow in these very small scales or whether should they be modified and, if so, how; (3) whether phenomena which typically are ignored at large scales become important at small scales; and (4) whether transition to turbulence is affected by the small size of the channels. The test structure consisted of a single channel etched in silicon using planar photolithographic micromachining techniques. Tentative results are reported. It is observed that, in channels with relatively large cross-sections, the fluid roughly behaves in accordance with predictions based on the N-S equations. In smaller-size channels there are large deviations between experimental observations and N-S predictions
  • Keywords
    channel flow; semiconductor technology; Navier Stokes equations; Si channels; channel flow; experimental observations; micron sized channels; planar photolithographic micromachining techniques; scales at which continuum assumptions break down; small channels; submicron size channels; test structure; transition to turbulence; Equations; Etching; Fluid flow; Fluid flow measurement; Glass; Liquids; Manufacturing; Pressure measurement; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1989, Proceedings, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots. IEEE
  • Conference_Location
    Salt Lake City, UT
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1989.77954
  • Filename
    77954