DocumentCode
2990127
Title
Effect of Bi on the microstructure evolution of Sn-3Ag-0.5Cu/Cu solder joint
Author
Lin, Qi ; Jie, Zhao ; Lai, Wang ; Shuangqi, Han
Author_Institution
Dept. of Mater. Eng., Dalian Univ. of Technol., China
fYear
2003
fDate
28-30 Oct. 2003
Firstpage
265
Lastpage
269
Abstract
The reliability of the solder joints is very important for lead-free solders to be applied extensively. The properties of joints have a close relationship with microstructure of the joints (W. Yang et al., J. Electr. Mater. vol. 24, no. 10, 1995). Therefore, this paper studied the microstructure evolution of Sn-3Ag-0.5Cu-XBi/Cu (where X=0-3%) solder joints after aging at varying temperatures. Sn-Ag-Cu-Bi solders have been selected for research because experiments revealed the eutectic Sn-Ag-Cu alloy to be a very promising solder in avionics and automotive applications where the solder joints are subject to numerous thermal cycles and mechanical vibrations. It has good wetting properties and forms good quality joints with copper, and also has good thermo-mechanical properties and soldering technology (C.M. Miller et al, ibid., vol. 23, no. 7, 1994), but compared with SnPb eutectic, it has higher melting temperature and high cost. It is well known that Bi has beneficial effect on mechanical properties of bulk solder when the addition of Bi is within 3%; however, there are only initial reports on the effect of Bi in solder joints, and a full understanding of Bi effects in solder applications is crucial.
Keywords
ageing; bismuth alloys; copper alloys; electronics packaging; environmental degradation; environmental factors; silver alloys; soldering; solders; tin alloys; wetting; Bi effect; Cu; Sn-Ag-Cu-Bi solders; Sn-Ag-Cu-Bi/Cu solder joints; Sn-Ag-Cu/Cu solder joint; SnAgCuBi-Cu; aging temperature; automotive applications; avionics applications; bulk solder mechanical properties; eutectic Sn-Ag-Cu alloy; lead-free solders; mechanical vibrations; melting temperature; microstructure evolution; solder cost; solder joint reliability; thermal cycles; thermo-mechanical properties; wetting properties; Aerospace electronics; Aging; Automotive applications; Bismuth; Copper; Environmentally friendly manufacturing techniques; Lead; Microstructure; Soldering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology Proceedings, 2003. ICEPT 2003. Fifth International Conference on
Conference_Location
Shanghai, China
Print_ISBN
0-7803-8168-8
Type
conf
DOI
10.1109/EPTC.2003.1298737
Filename
1298737
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