• DocumentCode
    2990127
  • Title

    Effect of Bi on the microstructure evolution of Sn-3Ag-0.5Cu/Cu solder joint

  • Author

    Lin, Qi ; Jie, Zhao ; Lai, Wang ; Shuangqi, Han

  • Author_Institution
    Dept. of Mater. Eng., Dalian Univ. of Technol., China
  • fYear
    2003
  • fDate
    28-30 Oct. 2003
  • Firstpage
    265
  • Lastpage
    269
  • Abstract
    The reliability of the solder joints is very important for lead-free solders to be applied extensively. The properties of joints have a close relationship with microstructure of the joints (W. Yang et al., J. Electr. Mater. vol. 24, no. 10, 1995). Therefore, this paper studied the microstructure evolution of Sn-3Ag-0.5Cu-XBi/Cu (where X=0-3%) solder joints after aging at varying temperatures. Sn-Ag-Cu-Bi solders have been selected for research because experiments revealed the eutectic Sn-Ag-Cu alloy to be a very promising solder in avionics and automotive applications where the solder joints are subject to numerous thermal cycles and mechanical vibrations. It has good wetting properties and forms good quality joints with copper, and also has good thermo-mechanical properties and soldering technology (C.M. Miller et al, ibid., vol. 23, no. 7, 1994), but compared with SnPb eutectic, it has higher melting temperature and high cost. It is well known that Bi has beneficial effect on mechanical properties of bulk solder when the addition of Bi is within 3%; however, there are only initial reports on the effect of Bi in solder joints, and a full understanding of Bi effects in solder applications is crucial.
  • Keywords
    ageing; bismuth alloys; copper alloys; electronics packaging; environmental degradation; environmental factors; silver alloys; soldering; solders; tin alloys; wetting; Bi effect; Cu; Sn-Ag-Cu-Bi solders; Sn-Ag-Cu-Bi/Cu solder joints; Sn-Ag-Cu/Cu solder joint; SnAgCuBi-Cu; aging temperature; automotive applications; avionics applications; bulk solder mechanical properties; eutectic Sn-Ag-Cu alloy; lead-free solders; mechanical vibrations; melting temperature; microstructure evolution; solder cost; solder joint reliability; thermal cycles; thermo-mechanical properties; wetting properties; Aerospace electronics; Aging; Automotive applications; Bismuth; Copper; Environmentally friendly manufacturing techniques; Lead; Microstructure; Soldering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology Proceedings, 2003. ICEPT 2003. Fifth International Conference on
  • Conference_Location
    Shanghai, China
  • Print_ISBN
    0-7803-8168-8
  • Type

    conf

  • DOI
    10.1109/EPTC.2003.1298737
  • Filename
    1298737