Title :
A validation of the IEM surface scattering model
Author :
Fung, A.K. ; Chen, K.S.
Author_Institution :
Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
Abstract :
A surface scattering model based on the integral equation method is examined in terms of its applicability to laboratory and field measurements. The examination covers angular, polarization and frequency properties and includes backscattering and bistatic cases. The laboratory measurements include both backscattering and bistatic scattering from a statistically known, perfectly conducting rough surface which has a Gaussian height distribution and a Gaussian correlation function with rms height of 0.25 cm and correlation length- of 2 cm. The frequency range is from 5 GHz to 10 GHz so that the low, medium andhigh frequency regions are included. The angular variation covers 15 to 55 degrees and all four linear polarizations are available in bistatic scattering. The second set of laboratory backscattering measurements of another perfectly conducting surface with a rms height of 0.85 mm, a correlation length of 6.2 mm and a non-Gaussian correlated function is also tested against this surface scattering model. The third set of laboratory measurements is from a 12 cm thick saline ice
Keywords :
backscatter; electromagnetic wave scattering; geophysical techniques; oceanographic techniques; radar applications; radar cross-sections; radar polarimetry; remote sensing by radar; sea ice; 1.5 to 10 GHz; IEM surface scattering model; angular dependence; backscatter; backscattering; bistatic; frequency properties; geophysical measurement technique; incidence angle; integral equation method; land surface; microwave SHF; ocean; polarization; radar remote sensing; radar scattering; rough surface; sea ice; sea surface; terrain mapping; Backscatter; Frequency; Integral equations; Laboratories; Length measurement; Polarization; Rough surfaces; Scattering; Surface roughness; Testing;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1995. IGARSS '95. 'Quantitative Remote Sensing for Science and Applications', International
Conference_Location :
Firenze
Print_ISBN :
0-7803-2567-2
DOI :
10.1109/IGARSS.1995.521100