DocumentCode :
2990553
Title :
On the measurement of frequency and of its sample variance with high-resolution counters
Author :
Rubiola, Enrico ; Vernotte, François ; Giordano, Vincent
Author_Institution :
Dept. LPMO, FEMTO-ST Inst., Besangon
fYear :
2005
fDate :
29-31 Aug. 2005
Abstract :
A frequency counter measures the input frequency nu averaged over a suitable time tau, versus the reference clock. Beside clock interpolation, modern counters improve the resolution by averaging multiple measurements highly overlapped. In the presence of white noise, the overlapping technique improves the square uncertainty from sigma nu 2 prop1/tau2 to sigmanu 2 prop1/tau. This is important because the input trigger integrates white noise over the full instrument bandwidth, which is usually of at least 100 MHz. Due to insufficient technical information, the general user is inclined to make the implicit assumption that the counter takes the bare mean. After explaining the overlapped-average mechanism, we prove that feeding a file of contiguous data into the formula of the two-sample (Allan) variance sigmay 2(tau) = E{frac12(ymacrk+1-ymacrk)2} gives the modified Allan variance mod sigmay 2 (tau). This conclusion is based on the mathematical reverse-engineering of the formulae found in technical specifications. More details are available on the web site arxiv.org, document arXiv:physics/0411227 (Rubiola, 2004), Our purpose is to warn the experimentalists against possible mistakes, and to encourage the manufacturers to explain what the instruments really do
Keywords :
clocks; frequency measurement; frequency meters; measurement standards; time measurement; white noise; Allan variance mod; clock interpolation; frequency measurement; sample variance; square uncertainty; white noise; Clocks; Counting circuits; Frequency conversion; Frequency measurement; Instruments; Interpolation; Phase noise; Pulse measurements; Time measurement; White noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-9053-9
Type :
conf
DOI :
10.1109/FREQ.2005.1573901
Filename :
1573901
Link To Document :
بازگشت