Title :
On the power dependence of extraneous microwave fields in atomic frequency standards
Author :
Jefferts, S.R. ; Shirley, J.H. ; Ashby, N. ; Heavner, T.P. ; Donley, E.A. ; Levi, F.
Author_Institution :
Div. of Time & Frequency, NIST, Boulder, CO, USA
Abstract :
We show that the frequency bias caused by distributed cavity phase has a strong dependence on microwave power. We also show that frequency biases associated with microwave leakage have distinct signatures in their dependence on microwave power and the physical location of the leakage interaction with the atom.
Keywords :
frequency standards; microwaves; atomic frequency standards; distributed cavity phase; extraneous microwave fields; microwave leakage; microwave power; Atomic clocks; Doppler shift; Frequency conversion; Laser beams; Laser theory; Masers; NIST; Resonance; Tellurium; Testing;
Conference_Titel :
Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
Print_ISBN :
0-7803-9053-9
DOI :
10.1109/FREQ.2005.1573910
