Title :
Abstract tests based on SysML models for EMV Card
Author :
Ouerdi, Noura ; Ziane, M´Hammed ; Azizi, A. ; Azizi, Masood ; Lanet, Jean-Louis
Author_Institution :
Lab. ACSA, Mohammed First Univ., Oujda, Morocco
Abstract :
The smart cards are increasingly used in several fields with critical data that require security. We cite, as example, the medical field and payment shopping with smart card. Therefore, the hardware and software security of smart cards is one of the key elements of the security of sensitive information handled. Currently, several scientific researchers are interested in studying and enhancing the smart cards security. The study of vulnerabilities is a prerequisite for building security guarantees of this type of devices. Indeed, each vulnerability can easily lead to an attack. In this paper, we generate vulnerability test cases based on models of Europay-MasterCard and Visa (EMV) specifications.
Keywords :
credit transactions; program testing; security of data; smart cards; EMV card; Eutopay-Visa-Mastercard; SysML model; abstract test; hardware security; medical field; payment shopping; security guarantee; sensitive information security; smart card; software security; vulnerability test; Cryptography; Educational institutions; Frequency locked loops; Smart cards; Standards; Testing; Unified modeling language; EMV; Event-B; SysML; smart and card; test cases;
Conference_Titel :
Security Days (JNS3), 2013 National
Conference_Location :
Rabat
Print_ISBN :
978-1-4799-0322-1
DOI :
10.1109/JNS3.2013.6595461