• DocumentCode
    2990861
  • Title

    Nonlinear dynamic model of credit risk contagion in CRT market

  • Author

    Chen Ting-qiang ; Yin Qun-yao ; He Jian-min

  • fYear
    2012
  • fDate
    20-22 Sept. 2012
  • Firstpage
    250
  • Lastpage
    256
  • Abstract
    In this article, we build a nonlinear dynamics model of credit risk contagion in CRT market based on the connections of the complex relationship network between participants in CRT market only include Newman-Watts length scale connection and long distance connection, and study its dynamic behaviors. We find that, firstly, the increase of the effective rate of credit risk contagion can make the status curve of credit risk contagion happen some significant changes, further engender the Hopf bifurcation and chaos phenomenon in the process of credit risk contagion through experimental simulation. Secondly, the increase of the nonlinear resistance coefficient make Hopf bifurcation and chaos phenomena happen in advance. Thirdly, there are series of periodic windows in the chaos interval inside, in which present three intertwined state about Hopf bifurcation, pour bifurcation and chaos.
  • Keywords
    bifurcation; chaos; credit transactions; marketing; nonlinear dynamical systems; risk management; CRT market; Hopf bifurcation; Newman-Watts length scale connection; chaos interval; chaos phenomenon; complex relationship network; credit risk contagion process; credit risk transfer; effective credit risk contagion rate; experimental simulation; long distance connection; nonlinear dynamic model; nonlinear resistance coefficient; periodic windows; pour bifurcation; status curve; Bifurcation; Chaos; Mathematical model; Nonlinear dynamical systems; Oscillators; Resistance; Stability analysis; CRT market; Chaos; Hopf bifurcation; credit risk contagion; experimental simulation; nonlinear dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management Science and Engineering (ICMSE), 2012 International Conference on
  • Conference_Location
    Dallas, TX
  • ISSN
    2155-1847
  • Print_ISBN
    978-1-4673-3015-2
  • Type

    conf

  • DOI
    10.1109/ICMSE.2012.6414191
  • Filename
    6414191