DocumentCode
2990884
Title
Faults Detection Approach for Self-Testable RF MEMS
Author
Islam, Syed Zahidul ; Wong, Wallace ; Tiong, Su Hieng ; Ali, Mohd Alauddin Mohd
Author_Institution
Swinburne Univ. of Technol. (Sarawak Campus), Kuching
fYear
2006
fDate
Oct. 29 2006-Dec. 1 2006
Firstpage
329
Lastpage
333
Abstract
Efficient built-in or external test strategies are becoming essential in micro-electromechanical systems (MEMS), especially for high reliability and safety critical applications. This paper describes self- testable and self-reparable RF MEMS fault testing approach. Simulation results show the effects of switches faults in MEMS.
Keywords
built-in self test; fault diagnosis; micromechanical devices; reliability; built-in test strategies; external test strategies; faults detection approach; micro- electromechanical systems; self-reparable RF MEMS fault testing approach; self-testable RF MEMS; switches faults; Analytical models; Built-in self-test; Fault detection; Manufacturing; Microelectromechanical devices; Micromechanical devices; Radio frequency; Radiofrequency microelectromechanical systems; Switches; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
0-7803-9730-4
Electronic_ISBN
0-7803-9731-2
Type
conf
DOI
10.1109/SMELEC.2006.381075
Filename
4266625
Link To Document