Title :
Faults Detection Approach for Self-Testable RF MEMS
Author :
Islam, Syed Zahidul ; Wong, Wallace ; Tiong, Su Hieng ; Ali, Mohd Alauddin Mohd
Author_Institution :
Swinburne Univ. of Technol. (Sarawak Campus), Kuching
fDate :
Oct. 29 2006-Dec. 1 2006
Abstract :
Efficient built-in or external test strategies are becoming essential in micro-electromechanical systems (MEMS), especially for high reliability and safety critical applications. This paper describes self- testable and self-reparable RF MEMS fault testing approach. Simulation results show the effects of switches faults in MEMS.
Keywords :
built-in self test; fault diagnosis; micromechanical devices; reliability; built-in test strategies; external test strategies; faults detection approach; micro- electromechanical systems; self-reparable RF MEMS fault testing approach; self-testable RF MEMS; switches faults; Analytical models; Built-in self-test; Fault detection; Manufacturing; Microelectromechanical devices; Micromechanical devices; Radio frequency; Radiofrequency microelectromechanical systems; Switches; Testing;
Conference_Titel :
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
0-7803-9730-4
Electronic_ISBN :
0-7803-9731-2
DOI :
10.1109/SMELEC.2006.381075
