• DocumentCode
    2991038
  • Title

    Design of 100nm Single-Electron Transistor (SET) by 2D TCAD Simulation

  • Author

    Rasmi, Amiza ; Hashim, Uda ; Mat, Abdul Fatah Awang

  • Author_Institution
    UPM-MTDC, Serdang
  • fYear
    2006
  • fDate
    Oct. 29 2006-Dec. 1 2006
  • Firstpage
    367
  • Lastpage
    372
  • Abstract
    One of the great problems in current large-scale integrated circuits (LSIs) is increasing power dissipation in a small silicon chip. Single-electron transistor (SET) which operate by means of one-by-one electron transfer, small size and consume very low power are suitable for achieving higher levels of integration. In this paper, SET is designed with 100 nm gate length and 10 nm gate width is successfully simulated by Synopsys TCAD. The power of SET device that obtained from simulation is 3.771 times 10-9 Watt for fixed current and 3.3565 times 10-9 Watt if fixed the gate voltage, VG, and the capacitance of this device is 0.4297 aF. These results were achieved at room temperature operation.
  • Keywords
    circuit simulation; integrated circuit design; single electron transistors; 2D TCAD simulation; LSI; SET; Synopsys TCAD; large-scale integrated circuits; one-by-one electron transfer; power dissipation; silicon chip; single-electron transistor; Capacitance; FETs; Impedance; Integrated circuit technology; Large scale integration; Low voltage; Medical simulation; Nanoscale devices; Single electron devices; Single electron transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    0-7803-9730-4
  • Electronic_ISBN
    0-7803-9731-2
  • Type

    conf

  • DOI
    10.1109/SMELEC.2006.381083
  • Filename
    4266633