• DocumentCode
    2991093
  • Title

    Development of SiC/MgO Distributed Bragg Reflector using RF Magnetron Sputtering Technique

  • Author

    Anuar, M.S.K. ; Soetedjo, Hariyadi ; Sharizal, A.M. ; Sufian, S.M. ; Boon, T.G. ; Saadah, A.R. ; Razman, Y.M. ; Fatah, A.M.A.

  • Author_Institution
    UPM-MTDC, Serdang
  • fYear
    2006
  • fDate
    Oct. 29 2006-Dec. 1 2006
  • Firstpage
    378
  • Lastpage
    381
  • Abstract
    A Bragg mirror structure is an essential part for vertical cavity surface emission laser (VCSEL) applications. High optical reflectance at required stopband width is one of major concern by means of application requirements. For this purpose, Bragg mirrors consisting of SiC/MgO multilayers have been developed using an RF magnetron sputtering technique at room temperature. These structures have been characterized using various measurement techniques like ellipsometry, reflectance spectroscopy, Fourier transform infrared (FTIR) spectroscopy, scanning electron microscopy (SEM) and X-ray diffraction (XRD) technique. From these measurements, it was confirmed that mirror materials were deposited on the substrates. For application requirement, the DBR mirror structure fabricated using only a seven period SiC/MgO multilayered structure produced the expected stop-band at 850 nm wavelength with high reflectivity of 95%.
  • Keywords
    Fourier transform spectra; X-ray diffraction; distributed Bragg reflectors; ellipsometry; infrared spectra; laser cavity resonators; laser mirrors; magnesium compounds; optical multilayers; reflectivity; scanning electron microscopy; silicon compounds; sputter deposition; Bragg mirror structure; DBR mirror structure; Fourier transform infrared spectroscopy; RF magnetron sputtering technique; SEM; SiC-MgO; VCSEL; X-ray diffraction; XRD; distributed Bragg reflector; ellipsometry; multilayers; optical reflectance; reflectance spectroscopy; reflectivity; scanning electron microscopy; vertical cavity surface emission laser; wavelength 850 nm; Distributed Bragg reflectors; Infrared spectra; Mirrors; Radio frequency; Reflectivity; Scanning electron microscopy; Silicon carbide; Spectroscopy; Sputtering; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    0-7803-9730-4
  • Electronic_ISBN
    0-7803-9731-2
  • Type

    conf

  • DOI
    10.1109/SMELEC.2006.381085
  • Filename
    4266635