• DocumentCode
    2991560
  • Title

    Self-related traces: An alternative to full-system simulation for NoCs

  • Author

    Triviño, Francisco ; Andujar, Francisco J. ; Alfaro, Francisco J. ; Sánchez, José L. ; Ros, Alberto

  • Author_Institution
    Univ. de Castilla-La Mancha, Spain
  • fYear
    2011
  • fDate
    4-8 July 2011
  • Firstpage
    819
  • Lastpage
    824
  • Abstract
    The network-on-chip (NoC) has become an integral part of multicore systems and multiprocessor systems-on-chip (MPSoCs). Detailed simulation models are one of the most common techniques to evaluate the performance of a NoC. Most of these models only include a subset of the complete architecture and use only synthetic traffic. However, there is usually a combined effect of other components of the architecture that can impact the obtained results. Thus, an alternative consists in modeling a full-system to obtain a complete architecture that allows us to simulate real work loads with high accuracy. In this paper, we first present the INetwork interface which allows us to include any network simulator inside the Simics-GEMS system. For testing the simulator, we present a simple case of study for a baseline NoC model running real applications. We also present a trace-driven model based on self-related traces which allows using just the NoC simulator.
  • Keywords
    computer architecture; multiprocessing systems; network-on-chip; INetwork interface; Simics-GEMS system; baseline network-on-chip model; full-system simulation; multicore system; multiprocessor systems-on-chip; network simulator; performance evaluation; self-related traces; synthetic traffic; trace-driven model; Accuracy; Computational modeling; Garnets; Multiprocessor interconnection; Protocols; Timing; Full-System; Multicore; Network-on-Chip; Simulation; Trace-Driven;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computing and Simulation (HPCS), 2011 International Conference on
  • Conference_Location
    Istanbul
  • Print_ISBN
    978-1-61284-380-3
  • Type

    conf

  • DOI
    10.1109/HPCSim.2011.5999914
  • Filename
    5999914