• DocumentCode
    2991682
  • Title

    Decentralized two-sided sequential tests for A normal mean

  • Author

    Wang, Yan ; Mei, Yajun

  • Author_Institution
    Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2009
  • fDate
    June 28 2009-July 3 2009
  • Firstpage
    2408
  • Lastpage
    2412
  • Abstract
    This article is concerned with decentralized sequential testing of a normal mean mu with two-sided alternatives. It is assumed that in a single-sensor network system with limited local memory, i.i.d. normal raw observations are observed at the local sensor, and quantized into binary messages that are sent to the fusion center, which makes a final decision between the null hypothesis H0 : mu = 0 and the alternative hypothesis H1 : mu = plusmn1. We propose a decentralized sequential test using the idea of tandem quantizers (or equivalently, a one-shot feedback). Surprisingly, our proposed test only uses the quantizers of the form I(Xn ges lambda), but it is shown to be asymptotically Bayes. Moreover, by adopting the principle of invariance, we also investigate decentralized invariant tests with the stationary quantizers of the form I(|Xn| > lambda), and show that lambda = 0.5 only leads to a suboptimal decentralized invariant sequential test. Numerical simulations are conducted to support our arguments.
  • Keywords
    normal distribution; sensor fusion; binary messages; decentralized two-sided sequential tests; fusion center; normal mean; single-sensor network system; suboptimal decentralized invariant sequential test; tandem quantizers; Context; Feedback; Numerical simulation; Sensor fusion; Sensor systems; Sequential analysis; Signal detection; Switches; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2009. ISIT 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4312-3
  • Electronic_ISBN
    978-1-4244-4313-0
  • Type

    conf

  • DOI
    10.1109/ISIT.2009.5206018
  • Filename
    5206018