DocumentCode :
2991682
Title :
Decentralized two-sided sequential tests for A normal mean
Author :
Wang, Yan ; Mei, Yajun
Author_Institution :
Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2009
fDate :
June 28 2009-July 3 2009
Firstpage :
2408
Lastpage :
2412
Abstract :
This article is concerned with decentralized sequential testing of a normal mean mu with two-sided alternatives. It is assumed that in a single-sensor network system with limited local memory, i.i.d. normal raw observations are observed at the local sensor, and quantized into binary messages that are sent to the fusion center, which makes a final decision between the null hypothesis H0 : mu = 0 and the alternative hypothesis H1 : mu = plusmn1. We propose a decentralized sequential test using the idea of tandem quantizers (or equivalently, a one-shot feedback). Surprisingly, our proposed test only uses the quantizers of the form I(Xn ges lambda), but it is shown to be asymptotically Bayes. Moreover, by adopting the principle of invariance, we also investigate decentralized invariant tests with the stationary quantizers of the form I(|Xn| > lambda), and show that lambda = 0.5 only leads to a suboptimal decentralized invariant sequential test. Numerical simulations are conducted to support our arguments.
Keywords :
normal distribution; sensor fusion; binary messages; decentralized two-sided sequential tests; fusion center; normal mean; single-sensor network system; suboptimal decentralized invariant sequential test; tandem quantizers; Context; Feedback; Numerical simulation; Sensor fusion; Sensor systems; Sequential analysis; Signal detection; Switches; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
Type :
conf
DOI :
10.1109/ISIT.2009.5206018
Filename :
5206018
Link To Document :
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