DocumentCode
2991682
Title
Decentralized two-sided sequential tests for A normal mean
Author
Wang, Yan ; Mei, Yajun
Author_Institution
Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2009
fDate
June 28 2009-July 3 2009
Firstpage
2408
Lastpage
2412
Abstract
This article is concerned with decentralized sequential testing of a normal mean mu with two-sided alternatives. It is assumed that in a single-sensor network system with limited local memory, i.i.d. normal raw observations are observed at the local sensor, and quantized into binary messages that are sent to the fusion center, which makes a final decision between the null hypothesis H0 : mu = 0 and the alternative hypothesis H1 : mu = plusmn1. We propose a decentralized sequential test using the idea of tandem quantizers (or equivalently, a one-shot feedback). Surprisingly, our proposed test only uses the quantizers of the form I(Xn ges lambda), but it is shown to be asymptotically Bayes. Moreover, by adopting the principle of invariance, we also investigate decentralized invariant tests with the stationary quantizers of the form I(|Xn| > lambda), and show that lambda = 0.5 only leads to a suboptimal decentralized invariant sequential test. Numerical simulations are conducted to support our arguments.
Keywords
normal distribution; sensor fusion; binary messages; decentralized two-sided sequential tests; fusion center; normal mean; single-sensor network system; suboptimal decentralized invariant sequential test; tandem quantizers; Context; Feedback; Numerical simulation; Sensor fusion; Sensor systems; Sequential analysis; Signal detection; Switches; System testing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location
Seoul
Print_ISBN
978-1-4244-4312-3
Electronic_ISBN
978-1-4244-4313-0
Type
conf
DOI
10.1109/ISIT.2009.5206018
Filename
5206018
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